[PDF.19xd] Testing and Diagnosis of VLSI and ULSI (Nato Science Series E:)
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Testing and Diagnosis of VLSI and ULSI (Nato Science Series E:)
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| Springer | 1988-11-30 | Original language:English | PDF # 1 | 9.21 x1.25 x6.14l,2.06 | File type: PDF | 544 pages | |
This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Tradit...
You easily download any file type for your gadget.Testing and Diagnosis of VLSI and ULSI (Nato Science Series E:) | From Brand: Springer.Not only was the story interesting, engaging and relatable, it also teaches lessons.